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w-t-c.ae United Arab Emirates AE
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SEM Applications In Materials Science

إ.د 12500.00 - إ.د 12550.00 (AED)

Minimum order quantity 3700
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Products Description

Scanning electron microscopes are powerful imaging instruments that use a focused electron beam to scan the surface of a specimen, producing highly detailed 3D-like images. SEMs provide exceptional depth of field and magnification, making them ideal for studying surface topography, morphology, and composition.

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