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Verified SupplierFocused Ion Beam SEM For Nanofabrication
إ.د 17958.00 - إ.د 17980.00 (AED)
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Products Description
Focused Ion Beam (FIB) SEMs are dual-beam instruments that combine a scanning electron microscope with a focused ion beam system, enabling both high-resolution imaging and precise material modification. The SEM provides detailed surface imaging, while the ion beam allows site-specific milling, cross-sectioning, and deposition at the micro- and nanoscale.
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