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Verified SupplierConductive AFM Applications in Semiconductor Research
إ.د 8520.00 - إ.د 8530.00 (AED)
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Products Description
Conductive atomic force microscopes are specialized AFMs that combine high-resolution surface imaging with the ability to measure local electrical conductivity. A conductive probe scans the sample surface, providing simultaneous topographical and electrical property maps at the nanoscale.
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