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www.sep.ae United Arab Emirates AE
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Best Atomic Force Microscopes for Nanomaterials Study

إ.د 5200.00 - إ.د 5250.00 (AED)

Minimum order quantity 3200
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Products Description

Atomic force microscopes are high-resolution scanning probe instruments that map the surface topography of a specimen by measuring forces between a sharp probe and the sample. AFMs can operate in air, liquid, or vacuum environments, providing nanoscale imaging without requiring special sample coatings.

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